1. Defects in microelectronic materials and devices
Author: / edited by Daniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. Schrimpf
Library: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
Subject: Microelectronics--Materials--Testing,Metal oxide semiconductor field-effect transistors--Testing,Integrated circuits--Defects
Classification :
TK7871
.
D44
2009
